This equipment inspects wiring integrity and determines defect after connecting substrate wiring during the NANO LED manufacturing process.
A substrate set up for inspection is inspected for the wiring of the substrate using an optical meter, and the resistance of the wiring is measured.
After completion of inspection and measurement, save defective images (odd value measurement), extract data, and provide the user with the desired information.
Main Components
Load / Unload Transfer
Align Unit : Vision Align
Inspection Optic System : Acquires Raw image using optical instrument
Probe Unit
Wiring impedance measurement unit
Machine Key Specification
Dimension
L 1,600 x W 2,000 x H 1,800(mm)
* The above specification changes according to the Inspection Cell size.
